Поисковый запрос: (<.>K=ION$<.>) |
Общее количество найденных документов : 23
Показаны документы с 1 по 20 |
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| 1. | APPLICATIONS OF NUCLEAR MAGNETIC RESONANCE TO PARAMAGNETIC SPECIES/ed. H. SIGEL. - 1987
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| 2. | CHEMICAL IONIZATION MASS SPECTROMETRY. - 1983
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| 3. | ELECTRON CAPTURE NEGATIVE ION MASS SPECTRA OF ENVIRONMENTAL CONTAMINANTS AND RELATED COMPOUNDS. - 1988
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| 4. | ELECTRONIC ABSORPTION SPECTRA OF RADICAL IONS. - 1988
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| 5. | FIELD IONIZATION MASS SPECTROMETRY. - 1971
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| 6. | GASEOUS ION CHEMISTRY AND MASS SPECTROMETRY. - 1986
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| 7. | HANDBOOK OF STATIC SECONDARY ION MASS SPECTROMETRY (SIMS). - 1989
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| 8. | ION MASS SPECTRA. - 1974
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| 9. | ION PRODUCTION BY ELECTRON IMPACT. - 1962
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| 10. | ION SPECTROSCOPIES FOR SURFACE ANALYSIS. - 1991
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| 11. | MASS SPECTROMETRY AND ION-MOLECULE REACTIONS. - 1969
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| 12. | MASS SPECTROMETRY OF ORGANIC IONS. - 1963
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| 13. | METASTABLE IONS. - 1973
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| 14. | METASTABLE PROCURSOR IONS. A TABLE FOR USE IN MASS SPECTROMETRY. - 1973
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| 15. | PRACTICAL SURFACE ANALYSIS. SECOND EDITION. VOL.2 - ION AND NEUTRAL SPECTROSCOPY. - 1992
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| 16. | PRINCIPLES OF MASS SPECTROMETRY AND NEGATIVE IONS. - 1970
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| 17. | SECONDARY ION MASS SPECTROMETRY (SIMS 4): PROC. OF THE FOURTH INTERNATIONAL CONFERENCE, OSAKA, JAPAN, NOV. 13-19, 1983. - 1984
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| 18. | SECONDARY ION MASS SPECTROMETRY (SIMS 6): PROC. OF THE 6TH INTERNATIONAL CONFERENCE, VERSAILLES, FRANCE, 13-18 SEPT., 1987. - 1988
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| 19. | SECONDARY ION MASS SPECTROMETRY. SIMS IX. - 1994
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| 20. | SECONDARY ION MASS SPECTROMETRY: BASIC CONCEPTS, INSTRUMENTAL ASPECTS, APPLICATIONS AND TRENDS. - 1987
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